Further processing options

Trapping of charge carriers in Sr2B5O9Br:Eu2+ under irradiation with UV light

Bibliographic Details
Journal Title: Radiation Measurements
Authors and Corporations: Knitel, M.J, Dorenbos, P, Andriessen, J, van Eijk, C.W.E, Berezovskaya, I, Dotsenko, V
In: Radiation Measurements, 29, 1998, 3-4, p. 327-331
Type of Resource: E-Article
Language: English
published:
Elsevier BV
Subjects:
Instrumentation
Radiation